Abstract
Ion-implanted MESFETs have been fabricated on an inverted GaAs/AlGaAs heterostructure. The aluminium concentration in the AlGaAs is graded from 0% at the substrate to 30% at the heterointerface. A maximum extrinsic transconductance of 410mS/mm is achieved with 0.5 µm gate devices. This heterojunction ion-implanted FET (HIFET) also exhibits enhanced microwave performance, especially at low drain current, when compared to conventional ion-implanted GaAs MESFETs. At 20% of Idss, the current gain cutoff frequency ft is 40 GHz, which increases up to a maximum value of 47 GHz as the drain current rises. These characteristics of high ft and high gain at low current are advantageous for low-noise applications.
Original language | English (US) |
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Pages (from-to) | 1105-1106 |
Number of pages | 2 |
Journal | Electronics Letters |
Volume | 25 |
Issue number | 17 |
DOIs | |
State | Published - Aug 3 1989 |
Externally published | Yes |
Keywords
- FETs
- Ion implantation
- Microwave devices and components
- Semiconductor devices and materials
ASJC Scopus subject areas
- Electrical and Electronic Engineering