Enhanced IC modeling methodology for system-level ESD simulation

Jie Xiong; Zaichen Chen; Yang Xiu; Zhen Mu; Maxim Raginsky; Elyse Rosenbaum

Enhanced IC modeling methodology for system-level ESD simulation

Jie Xiong, Zaichen Chen, Yang Xiu, Zhen Mu, Maxim Raginsky, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

To enable accurate system-level ESD simulation, the quasi-static I-V model of an IC is enhanced through kernel regression to reflect its circuit board dependency; alternatively, a recurrent neural network may be used to generate a non-quasi-static transient model. Hybrid electromagnetic and circuit simulation is demonstrated for ESD-induced noise coupling analysis.

Original language	English (US)
Title of host publication	Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018
Publisher	ESD Association
ISBN (Electronic)	1585373028
State	Published - Oct 25 2018
Event	40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 - Reno, United States Duration: Sep 23 2018 → Sep 28 2018

Publication series

Name	Electrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume	2018-September
ISSN (Print)	0739-5159

Other

Other	40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018
Country/Territory	United States
City	Reno
Period	9/23/18 → 9/28/18

ASJC Scopus subject areas

Electrical and Electronic Engineering

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Enhanced IC modeling methodology for system-level ESD simulation. / Xiong, Jie; Chen, Zaichen; Xiu, Yang et al.
Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. ESD Association, 2018. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; Vol. 2018-September).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Xiong, J, Chen, Z, Xiu, Y, Mu, Z, Raginsky, M & Rosenbaum, E 2018, Enhanced IC modeling methodology for system-level ESD simulation. in Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. Electrical Overstress/Electrostatic Discharge Symposium Proceedings, vol. 2018-September, ESD Association, 40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018, Reno, United States, 9/23/18.

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Enhanced IC modeling methodology for system-level ESD simulation

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