Enhanced IC modeling methodology for system-level ESD simulation

Jie Xiong, Zaichen Chen, Yang Xiu, Zhen Mu, Maxim Raginsky, Elyse Rosenbaum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

To enable accurate system-level ESD simulation, the quasi-static I-V model of an IC is enhanced through kernel regression to reflect its circuit board dependency; alternatively, a recurrent neural network may be used to generate a non-quasi-static transient model. Hybrid electromagnetic and circuit simulation is demonstrated for ESD-induced noise coupling analysis.

Original languageEnglish (US)
Title of host publicationElectrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018
PublisherESD Association
ISBN (Electronic)1585373028
StatePublished - Oct 25 2018
Event40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 - Reno, United States
Duration: Sep 23 2018Sep 28 2018

Publication series

NameElectrical Overstress/Electrostatic Discharge Symposium Proceedings
Volume2018-September
ISSN (Print)0739-5159

Other

Other40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018
CountryUnited States
CityReno
Period9/23/189/28/18

Fingerprint

Recurrent neural networks
Circuit simulation
Networks (circuits)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Xiong, J., Chen, Z., Xiu, Y., Mu, Z., Raginsky, M., & Rosenbaum, E. (2018). Enhanced IC modeling methodology for system-level ESD simulation. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018 (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; Vol. 2018-September). ESD Association.

Enhanced IC modeling methodology for system-level ESD simulation. / Xiong, Jie; Chen, Zaichen; Xiu, Yang; Mu, Zhen; Raginsky, Maxim; Rosenbaum, Elyse.

Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. ESD Association, 2018. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings; Vol. 2018-September).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Xiong, J, Chen, Z, Xiu, Y, Mu, Z, Raginsky, M & Rosenbaum, E 2018, Enhanced IC modeling methodology for system-level ESD simulation. in Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. Electrical Overstress/Electrostatic Discharge Symposium Proceedings, vol. 2018-September, ESD Association, 40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018, Reno, United States, 9/23/18.
Xiong J, Chen Z, Xiu Y, Mu Z, Raginsky M, Rosenbaum E. Enhanced IC modeling methodology for system-level ESD simulation. In Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. ESD Association. 2018. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).
Xiong, Jie ; Chen, Zaichen ; Xiu, Yang ; Mu, Zhen ; Raginsky, Maxim ; Rosenbaum, Elyse. / Enhanced IC modeling methodology for system-level ESD simulation. Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018. ESD Association, 2018. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).
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