Enhanced electrochemical deposition with an atomic force microscope

Keyphrases

• Atomic Force Microscope 100%
• Tip-sample Interaction 100%
• Electrochemical Deposition 100%
• Nanometer Scale 50%
• Cu Surface 50%
• Precision Control 50%
• Nucleation Mechanism 50%
• In Situ Atomic Force Microscopy 50%
• Growth Mechanism 50%
• Epitaxial 50%
• Solid-liquid Interface 50%
• Cu Species 50%
• Growth Rate 50%
• Passivation Layer 50%
• Single Crystal Cu 50%
• Heterogeneous nucleation 50%
• Electrochemical Desorption 50%
• Protection-deprotection 50%
• Heterogeneous Growth 50%
• Surface Defect Sites 50%

Engineering

• Atomic Force Microscope 100%
• Sample Interaction 100%
• Electrochemical Deposition 100%
• Nanometre 50%
• Atomic Force Microscopy 50%
• Defect Site 50%
• Feature Size 50%
• Growth Mechanism 50%
• Cu Surface 50%
• Nucleation Mechanism 50%
• Create Surface 50%
• Heterogeneous Nucleation 50%
• Copper (Cu) 50%
• Surface Defect 50%

Material Science

• Electrodeposition 100%
• Nucleation 50%
• Liquid Interface 50%
• Surface Defect 50%
• Single Crystal 50%
• Atomic Force Microscopy 50%