Engineering the quantum point contact response to single-electron charging in a few-electron quantum-dot circuit

L. X. Zhang, J. P. Leburton, R. Hanson, L. P. Kouwenhoven

Research output: Contribution to journalArticlepeer-review

Abstract

The benefit of quantum point contact (QPC) to enhance the detector sensitivity to the single-electron charging in a quantum dot was described. The QPC is based on the self-consistent solution of coupled three-dimensional Kohn-Sham and Poisson equations for the quantum circuit. The single-quantum measurement achieved in quantum circuit helps in realization of electronic devices for quantum information processing. The computer modeling was used to simulate the correlation between the charging of the quantum states in the laterally coupled quantum dot (LCQD) and the electrostatic varaition in the QPC.

Original languageEnglish (US)
Pages (from-to)2628-2630
Number of pages3
JournalApplied Physics Letters
Volume85
Issue number13
DOIs
StatePublished - Sep 27 2004

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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