TY - GEN
T1 - Energy-reliability limits in nanoscale circuits
AU - Chatterjee, Avhishek
AU - Varshney, Lav R.
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2017/3/27
Y1 - 2017/3/27
N2 - In the nanoscale regime, the behavior of both extant and emerging semiconductor devices are often unreliable. Reliability of such devices often trades-off with their energy consumption, speed, and/or chip area. We study the reliability-energy limits for circuits designed using such devices; examples are drawn from spin electronics. Using the mutual information propagation in logic circuits technique developed by Pippenger, together with optimization, we obtain lower bounds on the energy consumption for computing n-input Boolean functions. We observe that the minimum energy requirement is strictly higher in an order sense (as n scales) than that in the case of reliable gates.
AB - In the nanoscale regime, the behavior of both extant and emerging semiconductor devices are often unreliable. Reliability of such devices often trades-off with their energy consumption, speed, and/or chip area. We study the reliability-energy limits for circuits designed using such devices; examples are drawn from spin electronics. Using the mutual information propagation in logic circuits technique developed by Pippenger, together with optimization, we obtain lower bounds on the energy consumption for computing n-input Boolean functions. We observe that the minimum energy requirement is strictly higher in an order sense (as n scales) than that in the case of reliable gates.
KW - Energy-reliability function
KW - fault-tolerant computing
KW - nanoelectronics
UR - http://www.scopus.com/inward/record.url?scp=85018292528&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85018292528&partnerID=8YFLogxK
U2 - 10.1109/ITA.2016.7888169
DO - 10.1109/ITA.2016.7888169
M3 - Conference contribution
AN - SCOPUS:85018292528
T3 - 2016 Information Theory and Applications Workshop, ITA 2016
BT - 2016 Information Theory and Applications Workshop, ITA 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 Information Theory and Applications Workshop, ITA 2016
Y2 - 31 January 2016 through 5 February 2016
ER -