Energy-reliability limits in nanoscale circuits

Avhishek Chatterjee, Lav R. Varshney

Research output: Chapter in Book/Report/Conference proceedingConference contribution


In the nanoscale regime, the behavior of both extant and emerging semiconductor devices are often unreliable. Reliability of such devices often trades-off with their energy consumption, speed, and/or chip area. We study the reliability-energy limits for circuits designed using such devices; examples are drawn from spin electronics. Using the mutual information propagation in logic circuits technique developed by Pippenger, together with optimization, we obtain lower bounds on the energy consumption for computing n-input Boolean functions. We observe that the minimum energy requirement is strictly higher in an order sense (as n scales) than that in the case of reliable gates.

Original languageEnglish (US)
Title of host publication2016 Information Theory and Applications Workshop, ITA 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509025299
StatePublished - Mar 27 2017
Event2016 Information Theory and Applications Workshop, ITA 2016 - La Jolla, United States
Duration: Jan 31 2016Feb 5 2016

Publication series

Name2016 Information Theory and Applications Workshop, ITA 2016


Other2016 Information Theory and Applications Workshop, ITA 2016
Country/TerritoryUnited States
CityLa Jolla


  • Energy-reliability function
  • fault-tolerant computing
  • nanoelectronics

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Computer Science Applications
  • Artificial Intelligence
  • Information Systems
  • Signal Processing


Dive into the research topics of 'Energy-reliability limits in nanoscale circuits'. Together they form a unique fingerprint.

Cite this