@inproceedings{0db37eb03f8c495ab9374423d479d1c6,
title = "EM-CAD for complex electronics systems: A journey from order to chaos",
abstract = "In this paper, we present recent progress in the first-principles modeling and quantitative statistical analysis of complex electronics systems. The scientific contributions are twofold: (i) high-performance and scalable algorithms to conquer the computational complexity of extreme-scale simulations on massively parallel computing platforms; (ii) hybrid deterministic and stochastic formulations for the statistical characterization of the in-situ performance and system behavior. The work overcomes some key challenges in the in-situ verification of complex electronic systems in realistic circumstances, and significantly advance electromagnetic- A nd multiphysics-based computer-aided design (EM-CAD) for IC, electronics and microwave applications.",
author = "Zhen Peng and Shen Lin",
year = "2017",
month = jun,
day = "29",
doi = "10.1109/NEMO.2017.7964187",
language = "English (US)",
series = "2017 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization for RF, Microwave, and Terahertz Applications, NEMO 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "61--63",
booktitle = "2017 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization for RF, Microwave, and Terahertz Applications, NEMO 2017",
address = "United States",
note = "2017 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization for RF, Microwave, and Terahertz Applications, NEMO 2017 ; Conference date: 17-05-2017 Through 19-05-2017",
}