Ellipsometric measurements by use of photon pairs generated by spontaneous parametric downconversion

Ayman F. Abouraddy, Kimani C. Toussaint, Alexander V. Sergienko, Bahaa E.A. Saleh, Malvin C. Teich

Research output: Contribution to journalArticlepeer-review

Abstract

We present a novel interferometric technique for performing ellipsometric measurements. This technique relies on the use of a nonclassical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric downconversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute; i.e., they do not require source and detector calibration.

Original languageEnglish (US)
Pages (from-to)1717-1719
Number of pages3
JournalOptics Letters
Volume26
Issue number21
DOIs
StatePublished - Nov 1 2001

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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