Abstract
We present a novel interferometric technique for performing ellipsometric measurements. This technique relies on the use of a nonclassical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric downconversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute; i.e., they do not require source and detector calibration.
Original language | English (US) |
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Pages (from-to) | 1717-1719 |
Number of pages | 3 |
Journal | Optics Letters |
Volume | 26 |
Issue number | 21 |
DOIs | |
State | Published - Nov 1 2001 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics