@inbook{732c1354931945e39088fccbb4944de8,
title = "Elemental Distribution Profiling of Thin Films for Solar Cells",
keywords = "Auger electron spectroscopy (AES), Energydispersive X-ray spectrometry (EDX), Glow discharge-mass spectroscopy (GD-MS), Glow discharge-optical emission (GD-OES), Secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS)",
author = "Volker Hoffmann and Denis Klemm and Varvara Efimova and Cornel Venzago and Rockett, {Angus A.} and Thomas Wirth and Tim Nunney and Kaufmann, {Christian A.} and Raquel Caballero",
year = "2011",
month = apr,
day = "7",
doi = "10.1002/9783527636280.ch16",
language = "English (US)",
isbn = "9783527410033",
pages = "411--448",
booktitle = "Advanced Characterization Techniques for Thin Film Solar Cells",
publisher = "Wiley-VCH",
address = "Germany",
}