Elemental Distribution Profiling of Thin Films for Solar Cells

Volker Hoffmann, Denis Klemm, Varvara Efimova, Cornel Venzago, Angus A. Rockett, Thomas Wirth, Tim Nunney, Christian A. Kaufmann, Raquel Caballero

Research output: Chapter in Book/Report/Conference proceedingChapter

Original languageEnglish (US)
Title of host publicationAdvanced Characterization Techniques for Thin Film Solar Cells
PublisherWiley-VCH
Pages411-448
Number of pages38
ISBN (Print)9783527410033
DOIs
StatePublished - Apr 7 2011

Keywords

  • Auger electron spectroscopy (AES)
  • Energydispersive X-ray spectrometry (EDX)
  • Glow discharge-mass spectroscopy (GD-MS)
  • Glow discharge-optical emission (GD-OES)
  • Secondary ion mass spectroscopy (SIMS)
  • X-ray photoelectron spectroscopy (XPS)

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Hoffmann, V., Klemm, D., Efimova, V., Venzago, C., Rockett, A. A., Wirth, T., Nunney, T., Kaufmann, C. A., & Caballero, R. (2011). Elemental Distribution Profiling of Thin Films for Solar Cells. In Advanced Characterization Techniques for Thin Film Solar Cells (pp. 411-448). Wiley-VCH. https://doi.org/10.1002/9783527636280.ch16