Elemental and lattice-parameter mapping of binary oxide superlattices of (LaNiO3)4/(LaMnO3)2 at atomic resolution

Ji Hwan Kwon, Ping Lu, Jason Hoffman, Renliang Yuan, Aram Yoon, Anand Bhattacharya, Jian Min Zuo

Research output: Contribution to journalArticlepeer-review

Abstract

We construct the elemental distribution and lattice strain maps from the measured atomic column positions in a (LaNiO3)4/(LaMnO3)2 superlattice over a large field of view. The correlation between the distribution of B-cations and the lattice parameter in the form of Vegard's law is validated using atomic resolution energy dispersive x-ray spectroscopy (EDS). The maps show negligible Mn intermixing in the LaNiO3 layer, while Ni intermixing in the LaMnO3 layer improves away from the substrate interface to 9.5 atomic% from the 8th period onwards, indicating that the superlattice interfacial sharpness is established as the distance from the substrate increases. The maps allow an observation of the compositional defects of the B-sites, which is not possible by Z-contrast alone. Thus, this study demonstrates a promising approach for atomic scale correlative study of lattice strain and composition, and a method for the calibration of atomic resolution EDS maps.

Original languageEnglish (US)
Article number014002
JournalSemiconductor Science and Technology
Volume32
Issue number1
DOIs
StatePublished - Jan 2017

Keywords

  • EDS
  • Vegards law
  • composition
  • electron microscopy
  • strain
  • superlattice

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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