Element identification in organic samples utilizing a benchtop X-ray fluorescence emission tomography (XFET) system

A. Groll, J. George, P. J. La Riviére, L. J. Meng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Synchrotron-based X-ray fluorescence computed tomography (XFCT) is a common technique for mapping metal ions in biological specimens. In recent years, it has been demonstrated that various metal ions could play critical roles in disease and general biological functions. In this work, we are developing a benchtop x-ray fluorescence emission tomography system that utilizes combines charge-coupled device (CCD) detectors and special emission tomography apertures to obtain 3-D mapping of elemental distribution in intact biological samples. We have carried out a series of studies that utilize multiple slit apertures and a monochromatic pencil beam x-ray source to image a triple-tube sample and an osmium stained zebrafish.

Original languageEnglish (US)
Title of host publication2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479905348
DOIs
StatePublished - Jan 1 2013
Event2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013 - Seoul, Korea, Republic of
Duration: Oct 27 2013Nov 2 2013

Publication series

NameIEEE Nuclear Science Symposium Conference Record
ISSN (Print)1095-7863

Other

Other2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
CountryKorea, Republic of
CitySeoul
Period10/27/1311/2/13

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

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    Groll, A., George, J., La Riviére, P. J., & Meng, L. J. (2013). Element identification in organic samples utilizing a benchtop X-ray fluorescence emission tomography (XFET) system. In 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013 [6829026] (IEEE Nuclear Science Symposium Conference Record). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.2013.6829026