Electrostatic coupling of surface charge to bulk defect behavior in metal oxides

Prashun Gorai, Alice G. Hollister, Kristine Pangan-Okimoto, Edmund G. Seebauer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationMaterials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting
PublisherAIChE
Number of pages1
ISBN (Print)9781618397294
StatePublished - Jan 1 2011
EventMaterials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting - Minneapolis, United States
Duration: Oct 16 2011Oct 21 2016

Publication series

NameMaterials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting
Volume1

Other

OtherMaterials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting
CountryUnited States
CityMinneapolis
Period10/16/1110/21/16

ASJC Scopus subject areas

  • Chemical Health and Safety
  • Safety, Risk, Reliability and Quality
  • Safety Research

Cite this

Gorai, P., Hollister, A. G., Pangan-Okimoto, K., & Seebauer, E. G. (2011). Electrostatic coupling of surface charge to bulk defect behavior in metal oxides. In Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting (Materials Engineering and Sciences Division - Core Programming Topic at the 2011 AIChE Annual Meeting; Vol. 1). AIChE.