Electronic processing in flaw detection

T. S. Huang

Research output: Contribution to journalArticlepeer-review


We discuss very briefly how electronic, especially digital, techniques, could help flaw detection in three areas: cueing, automatic detection, and internal flaw detection.

Original languageEnglish (US)
Pages (from-to)20-21
Number of pages2
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - Oct 20 1975
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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