Abstract
We discuss very briefly how electronic, especially digital, techniques, could help flaw detection in three areas: cueing, automatic detection, and internal flaw detection.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 20-21 |
| Number of pages | 2 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 60 |
| DOIs | |
| State | Published - Oct 20 1975 |
| Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering