Electron Ptychography for Deep Sub-angstrom Resolution Without an Aberration Corrector

Chia Hao Lee; Yi Jiang; Kayla Nguyen; Priti Kharel; Yue Zhang; Arend van der Zande; P. Y. Huang

doi:10.1093/mam/ozae044.911

Electron Ptychography for Deep Sub-angstrom Resolution Without an Aberration Corrector

Chia Hao Lee, Yi Jiang, Kayla Nguyen, Priti Kharel, Yue Zhang, Arend van der Zande, P. Y. Huang

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	1842-1843
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
DOIs	https://doi.org/10.1093/mam/ozae044.911
State	Published - Jul 24 2024
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024

ASJC Scopus subject areas

Instrumentation

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10.1093/mam/ozae044.911

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@article{809b4b6a240043f1a37a367c93c68010,

title = "Electron Ptychography for Deep Sub-angstrom Resolution Without an Aberration Corrector",

author = "Lee, {Chia Hao} and Yi Jiang and Kayla Nguyen and Priti Kharel and Yue Zhang and {van der Zande}, Arend and Huang, {P. Y.}",

year = "2024",

month = jul,

day = "24",

doi = "10.1093/mam/ozae044.911",

language = "English (US)",

volume = "30",

pages = "1842--1843",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "2024",

note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

}

TY - JOUR

T1 - Electron Ptychography for Deep Sub-angstrom Resolution Without an Aberration Corrector

AU - Lee, Chia Hao

AU - Jiang, Yi

AU - Nguyen, Kayla

AU - Kharel, Priti

AU - Zhang, Yue

AU - van der Zande, Arend

AU - Huang, P. Y.

PY - 2024/7/24

Y1 - 2024/7/24

UR - http://www.scopus.com/inward/record.url?scp=85215674826&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85215674826&partnerID=8YFLogxK

U2 - 10.1093/mam/ozae044.911

DO - 10.1093/mam/ozae044.911

M3 - Conference article

AN - SCOPUS:85215674826

SN - 1431-9276

VL - 30

SP - 1842

EP - 1843

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2024

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

Electron Ptychography for Deep Sub-angstrom Resolution Without an Aberration Corrector

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