Electron nanodiffraction

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

This chapter introduces the practice and theory of electron nanodiffraction. After a brief introduction, the chapter provides a comprehensive description of electron diffraction techniques and their use for nanodiffraction. This is followed by discussions on electron probe properties, electron energy filtering and electron diffraction data analysis. Throughout the chapter, we emphasize different electron nanoprobes that can be formed inside an electron microscope, from a focused beam to parallel illumination, and how these probes can be used to extract structural information from different materials. For this purpose, we outline the electron diffraction theories based on both kinematic approximation and dynamic diffraction, which serve as the basis for the interpretation of electron nanodiffraction patterns. The principles and applications of scanning electron nanodiffraction and coherent diffraction imaging are covered in detail with applications for orientation mapping, imaging strain, 3-D nanostructure determination, and study of defects.

Original languageEnglish (US)
Title of host publicationSpringer Handbooks
PublisherSpringer
Pages905-969
Number of pages65
DOIs
StatePublished - 2019

Publication series

NameSpringer Handbooks
ISSN (Print)2522-8692
ISSN (Electronic)2522-8706

Keywords

  • Atomic resolution tomography
  • Convergent beam electron diffraction (CBED)
  • Diffractive imaging
  • Four-dimensional scanning transmission electron microscopy (4-D STEM)
  • Nanostructure analysis
  • Strain mapping

ASJC Scopus subject areas

  • General

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  • Cite this

    Zuo, J. M. (2019). Electron nanodiffraction. In Springer Handbooks (pp. 905-969). (Springer Handbooks). Springer. https://doi.org/10.1007/978-3-030-00069-1_18