| Original language | English (US) |
|---|---|
| Pages (from-to) | 188-189 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 14 |
| Issue number | SUPPL. 2 |
| DOIs | |
| State | Published - Aug 2008 |
ASJC Scopus subject areas
- Instrumentation
Electron microscopy of nanodevices: In situ and ex situ characterization of structure and transport properties of carbon nanotubes
J. M. Zuo, T. Kim, Q. Chen, L. M. Peng, E. A. Olson
Research output: Contribution to journal › Article › peer-review