Electron microscopy and diffraction of crystalline dendrimers and macrocycles

C. J. Buchko; P. M. Wilson; Z. Xu; J. Zhang; S. Lee; J. S. Moore; D. C. Martin

Electron microscopy and diffraction of crystalline dendrimers and macrocycles

C. J. Buchko
, P. M. Wilson
, Z. Xu
, J. Zhang
, S. Lee
, J. S. Moore
, D. C. Martin

Research output: Contribution to journal › Conference article › peer-review

Abstract

Reported in this paper is the transmission electron microscopy (TEM), selected area electron diffraction (SAED), and high resolution electron microscopy (HREM) studies of crystalline thin films formed by deposition of these materials onto carbon substrates from dilute solution. A JEOL 4000 EX operating at 400 kV and Philips EM420 operating at 120 kV are used.

Original language	English (US)
Pages (from-to)	1218-1219
Number of pages	2
Journal	Proceedings - Annual Meeting, Microscopy Society of America
State	Published - 1993
Externally published	Yes
Event	Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA Duration: Aug 1 1993 → Aug 6 1993

ASJC Scopus subject areas

General Engineering

Library availability

Discover UIUC Full Text

Cite this

@article{e8b3948ded9c4351bc55b0d0bdf1b625,

title = "Electron microscopy and diffraction of crystalline dendrimers and macrocycles",

abstract = "Reported in this paper is the transmission electron microscopy (TEM), selected area electron diffraction (SAED), and high resolution electron microscopy (HREM) studies of crystalline thin films formed by deposition of these materials onto carbon substrates from dilute solution. A JEOL 4000 EX operating at 400 kV and Philips EM420 operating at 120 kV are used.",

author = "Buchko, \{C. J.\} and Wilson, \{P. M.\} and Z. Xu and J. Zhang and S. Lee and Moore, \{J. S.\} and Martin, \{D. C.\}",

note = "PMW would like to thank the Air Force for a AFOSR fellowship. DCM and JSM would also like to thank NSF for National Young Investigator Awards. This work is sponsored by NSF grant CHE-9202095, the Michigan Memorial Phoenix Project, the College of Engineering, the 3M Company and the Petroleum Research Fund.; Proceedings of the 51st Annual Meeting Microscopy Society of America ; Conference date: 01-08-1993 Through 06-08-1993",

year = "1993",

language = "English (US)",

pages = "1218--1219",

journal = "Proceedings - Annual Meeting, Microscopy Society of America",

issn = "0424-8201",

}

TY - JOUR

T1 - Electron microscopy and diffraction of crystalline dendrimers and macrocycles

AU - Buchko, C. J.

AU - Wilson, P. M.

AU - Xu, Z.

AU - Zhang, J.

AU - Lee, S.

AU - Moore, J. S.

AU - Martin, D. C.

N1 - PMW would like to thank the Air Force for a AFOSR fellowship. DCM and JSM would also like to thank NSF for National Young Investigator Awards. This work is sponsored by NSF grant CHE-9202095, the Michigan Memorial Phoenix Project, the College of Engineering, the 3M Company and the Petroleum Research Fund.

PY - 1993

Y1 - 1993

N2 - Reported in this paper is the transmission electron microscopy (TEM), selected area electron diffraction (SAED), and high resolution electron microscopy (HREM) studies of crystalline thin films formed by deposition of these materials onto carbon substrates from dilute solution. A JEOL 4000 EX operating at 400 kV and Philips EM420 operating at 120 kV are used.

AB - Reported in this paper is the transmission electron microscopy (TEM), selected area electron diffraction (SAED), and high resolution electron microscopy (HREM) studies of crystalline thin films formed by deposition of these materials onto carbon substrates from dilute solution. A JEOL 4000 EX operating at 400 kV and Philips EM420 operating at 120 kV are used.

UR - https://www.scopus.com/pages/publications/0027707797

UR - https://www.scopus.com/pages/publications/0027707797#tab=citedBy

M3 - Conference article

AN - SCOPUS:0027707797

SN - 0424-8201

SP - 1218

EP - 1219

JO - Proceedings - Annual Meeting, Microscopy Society of America

JF - Proceedings - Annual Meeting, Microscopy Society of America

T2 - Proceedings of the 51st Annual Meeting Microscopy Society of America

Y2 - 1 August 1993 through 6 August 1993

ER -

Electron microscopy and diffraction of crystalline dendrimers and macrocycles

Abstract

ASJC Scopus subject areas

Library availability

Related links

Fingerprint

Cite this