Reported in this paper is the transmission electron microscopy (TEM), selected area electron diffraction (SAED), and high resolution electron microscopy (HREM) studies of crystalline thin films formed by deposition of these materials onto carbon substrates from dilute solution. A JEOL 4000 EX operating at 400 kV and Philips EM420 operating at 120 kV are used.
|Original language||English (US)|
|Number of pages||2|
|Journal||Proceedings - Annual Meeting, Microscopy Society of America|
|State||Published - Dec 1 1993|
|Event||Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA|
Duration: Aug 1 1993 → Aug 6 1993
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