TY - JOUR
T1 - Electron microscopy and diffraction of crystalline dendrimers and macrocycles
AU - Buchko, C. J.
AU - Wilson, P. M.
AU - Xu, Z.
AU - Zhang, J.
AU - Lee, S.
AU - Moore, J. S.
AU - Martin, D. C.
N1 - Funding Information:
PMW would like to thank the Air Force for a AFOSR fellowship. DCM and JSM would also like to thank NSF for National Young Investigator Awards. This work is sponsored by NSF grant CHE-9202095, the Michigan Memorial Phoenix Project, the College of Engineering, the 3M Company and the Petroleum Research Fund.
PY - 1993
Y1 - 1993
N2 - Reported in this paper is the transmission electron microscopy (TEM), selected area electron diffraction (SAED), and high resolution electron microscopy (HREM) studies of crystalline thin films formed by deposition of these materials onto carbon substrates from dilute solution. A JEOL 4000 EX operating at 400 kV and Philips EM420 operating at 120 kV are used.
AB - Reported in this paper is the transmission electron microscopy (TEM), selected area electron diffraction (SAED), and high resolution electron microscopy (HREM) studies of crystalline thin films formed by deposition of these materials onto carbon substrates from dilute solution. A JEOL 4000 EX operating at 400 kV and Philips EM420 operating at 120 kV are used.
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M3 - Conference article
AN - SCOPUS:0027707797
SN - 0424-8201
SP - 1218
EP - 1219
JO - Proceedings - Annual Meeting, Microscopy Society of America
JF - Proceedings - Annual Meeting, Microscopy Society of America
T2 - Proceedings of the 51st Annual Meeting Microscopy Society of America
Y2 - 1 August 1993 through 6 August 1993
ER -