Electron microscopy and diffraction of crystalline dendrimers and macrocycles

C. J. Buchko, P. M. Wilson, Z. Xu, J. Zhang, S. Lee, J. S. Moore, D. C. Martin

Research output: Contribution to journalConference articlepeer-review

Abstract

Reported in this paper is the transmission electron microscopy (TEM), selected area electron diffraction (SAED), and high resolution electron microscopy (HREM) studies of crystalline thin films formed by deposition of these materials onto carbon substrates from dilute solution. A JEOL 4000 EX operating at 400 kV and Philips EM420 operating at 120 kV are used.

Original languageEnglish (US)
Pages (from-to)1218-1219
Number of pages2
JournalProceedings - Annual Meeting, Microscopy Society of America
StatePublished - Dec 1 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

ASJC Scopus subject areas

  • Engineering(all)

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