Electron detection characteristics of slow-scan CCD camera

Research output: Contribution to journalArticlepeer-review

Abstract

The characteristics of two single-crystal YAG-based slow-scan CCD (SSC) cameras are measured and analyzed for various electron accelerating voltages. A stream-lined procedure for characterizing electron cameras is described, especially, the procedures for the measurement of modulation transfer function (MTF) and detector quantum efficiency (DQE). The limiting factors on the DQE of the SSC camera are studied, and possible improvements in the design are discussed. These analyses should be useful for the future improvement and optimization of SSC cameras for specific applications.

Original languageEnglish (US)
Pages (from-to)21-33
Number of pages13
JournalUltramicroscopy
Volume66
Issue number1-2
DOIs
StatePublished - Nov 1 1996
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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