Electromagnetic characterization of high-speed VLSI interconnects with perforated reference planes

A. C. Cangellaris

doi:10.1109/APS.1992.221658

Electromagnetic characterization of high-speed VLSI interconnects with perforated reference planes

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	1992 Joint Symposia
Subtitle of host publication	IEEE Antennas and Propagation Society International Symposium - 1992 Digest, AP-S 1992
Publisher	Institute of Electrical and Electronics Engineers Inc.
Number of pages	1
ISBN (Electronic)	0780307305
DOIs	https://doi.org/10.1109/APS.1992.221658
State	Published - 1992
Externally published	Yes
Event	1992 Joint Symposia Digest: IEEE Antennas and Propagation Society International Symposium, AP-S 1992 - Chicago, United States Duration: Jun 18 1992 → Jun 25 1992

Publication series

Name	IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
Volume	1992-June
ISSN (Print)	1522-3965

Conference

Conference	1992 Joint Symposia Digest: IEEE Antennas and Propagation Society International Symposium, AP-S 1992
Country/Territory	United States
City	Chicago
Period	6/18/92 → 6/25/92

ASJC Scopus subject areas

Electrical and Electronic Engineering

Online availability

10.1109/APS.1992.221658

Library availability

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Cangellaris, A. C. (1992). Electromagnetic characterization of high-speed VLSI interconnects with perforated reference planes. In 1992 Joint Symposia: IEEE Antennas and Propagation Society International Symposium - 1992 Digest, AP-S 1992 Article 221658 (IEEE Antennas and Propagation Society, AP-S International Symposium (Digest); Vol. 1992-June). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APS.1992.221658

Electromagnetic characterization of high-speed VLSI interconnects with perforated reference planes. / Cangellaris, A. C.
1992 Joint Symposia: IEEE Antennas and Propagation Society International Symposium - 1992 Digest, AP-S 1992. Institute of Electrical and Electronics Engineers Inc., 1992. 221658 (IEEE Antennas and Propagation Society, AP-S International Symposium (Digest); Vol. 1992-June).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Cangellaris, AC 1992, Electromagnetic characterization of high-speed VLSI interconnects with perforated reference planes. in 1992 Joint Symposia: IEEE Antennas and Propagation Society International Symposium - 1992 Digest, AP-S 1992., 221658, IEEE Antennas and Propagation Society, AP-S International Symposium (Digest), vol. 1992-June, Institute of Electrical and Electronics Engineers Inc., 1992 Joint Symposia Digest: IEEE Antennas and Propagation Society International Symposium, AP-S 1992, Chicago, United States, 6/18/92. https://doi.org/10.1109/APS.1992.221658

Cangellaris AC. Electromagnetic characterization of high-speed VLSI interconnects with perforated reference planes. In 1992 Joint Symposia: IEEE Antennas and Propagation Society International Symposium - 1992 Digest, AP-S 1992. Institute of Electrical and Electronics Engineers Inc. 1992. 221658. (IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)). doi: 10.1109/APS.1992.221658

Cangellaris, A. C. / Electromagnetic characterization of high-speed VLSI interconnects with perforated reference planes. 1992 Joint Symposia: IEEE Antennas and Propagation Society International Symposium - 1992 Digest, AP-S 1992. Institute of Electrical and Electronics Engineers Inc., 1992. (IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)).

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Electromagnetic characterization of high-speed VLSI interconnects with perforated reference planes

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