TY - GEN
T1 - Electrochemical-mechanically triggered transient electronics
AU - Sim, Kyoseung
AU - Wang, Xu
AU - Yu, Cunjiang
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/2/23
Y1 - 2017/2/23
N2 - Electronics, which functions for a designed time period and then degrades, holds promise in lots of areas, including medical implants, disposable electronic devices and data securing hardware. Here, we report a new type of transient electronics that is triggered through electrochemical-mechanical manner with robust and reliable mechanical design, low triggering voltage and fast transient characteristics. Such device is constructed through integrating electrochemical-mechanically triggered MEMS module with functional electronics. The electrochemical-mechanical triggering mechanism in this device opens up new vistas for transient electronics designs. Various materials and different type of electronics has been demonstrated.
AB - Electronics, which functions for a designed time period and then degrades, holds promise in lots of areas, including medical implants, disposable electronic devices and data securing hardware. Here, we report a new type of transient electronics that is triggered through electrochemical-mechanical manner with robust and reliable mechanical design, low triggering voltage and fast transient characteristics. Such device is constructed through integrating electrochemical-mechanically triggered MEMS module with functional electronics. The electrochemical-mechanical triggering mechanism in this device opens up new vistas for transient electronics designs. Various materials and different type of electronics has been demonstrated.
UR - http://www.scopus.com/inward/record.url?scp=85015797924&partnerID=8YFLogxK
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U2 - 10.1109/MEMSYS.2017.7863484
DO - 10.1109/MEMSYS.2017.7863484
M3 - Conference contribution
AN - SCOPUS:85015797924
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 620
EP - 623
BT - 2017 IEEE 30th International Conference on Micro Electro Mechanical Systems, MEMS 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 30th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2017
Y2 - 22 January 2017 through 26 January 2017
ER -