Abstract
We measure the electrical noise characteristics of doped silicon microcantilevers during cantilever self-heating over the temperature range 296-781 K. The dominant noise source is 1/f below about 10 kHz, while at higher frequency, the dominant noise source is Johnson noise. The 1/f noise matches the Hooge model. The noise floor is about 10 nV/Hz 1/2 and depends upon temperature, matching the theoretical Johnson noise. The Johnson noise-limited temperature resolution is about 1 K/Hz 1/2.
Original language | English (US) |
---|---|
Article number | 263107 |
Journal | Applied Physics Letters |
Volume | 99 |
Issue number | 26 |
DOIs | |
State | Published - Dec 26 2011 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)