@article{a9a12d10f34c4a4e8153db23d26f9b76,
title = "Electrical Double Layer of Supported Atomically Thin Materials",
abstract = "The electrical double layer (EDL), consisting of two parallel layers of opposite charges, is foundational to many interfacial phenomena and unique in atomically thin materials. An important but unanswered question is how the {"}transparency{"} of atomically thin materials to their substrates influences the formation of the EDL. Here, we report that the EDL of graphene is directly affected by the surface energy of the underlying substrates. Cyclic voltammetry and electrochemical impedance spectroscopy measurements demonstrate that graphene on hydrophobic substrates exhibits an anomalously low EDL capacitance, much lower than what was previously measured for highly oriented pyrolytic graphite, suggesting disturbance of the EDL ({"}disordered EDL{"}) formation due to the substrate-induced hydrophobicity to graphene. Similarly, electrostatic gating using EDL of graphene field-effect transistors shows much lower transconductance levels or even no gating for graphene on hydrophobic substrates, further supporting our hypothesis. Molecular dynamics simulations show that the EDL structure of graphene on a hydrophobic substrate is disordered, caused by the disruption of water dipole assemblies. Our study advances understanding of EDL in atomically thin limit.",
keywords = "2D materials, electrical double layer, graphene, surface energy",
author = "Kwon, \{Sun Sang\} and Jonghyun Choi and Mohammad Heiranian and Yerim Kim and Chang, \{Won Jun\} and Knapp, \{Peter M.\} and Wang, \{Michael Cai\} and Kim, \{Jin Myung\} and Aluru, \{Narayana R.\} and Park, \{Won Il\} and Nam, \{Sung Woo\}",
note = "S.N. gratefully acknowledges support from the NSF (MRSEC DMR-1720633 and DMR-1708852), DTRA (HDTRA1620298), NASA ECF (NNX16AR56G), ONR YIP (N00014-17-1-2830), and AFOSR (FA2386-17-1-4071). W.I.P. acknowledges this work supported by the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT and Future Planning (MSIP) (2018R1A2B2006410 and 2016K1A3A1A32913360) and the AFOSR/AOARD, USA (FA2386-18-1-4110). Experiments were carried out in part in the Illinois Materials Research Laboratory Central Research Facilities, Micro and Nano Technology Laboratory, and the Beckman Institute Imaging Technology Group at the University of Illinois at Urbana-Champaign. J.C. thanks the Jeongsong Cultural Foundation and FMC technologies. Inc. for fellowship support. P.M.K. acknowledges support from the NASA NSTRF (NNX16AM69H). S.N. gratefully acknowledges support from the NSF (MRSEC DMR-1720633 and DMR-1708852), DTRA (HDTRA1620298), NASA ECF (NNX16AR56G), ONR YIP (N00014-17-1-2830), and AFOSR (FA2386-17-1-4071). W.I.P. acknowledges this work supported by the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT and Future Planning (MSIP) (2018R1A2B2006410 and 2016K1A3A1A32913360) and the AFOSR/AOARD, USA (FA2386-18-1-4110). Experiments were carried out in part in the Illinois Materials Research Laboratory Central Research Facilities, Micro and Nano Technology Laboratory, and the Beckman Institute Imaging Technology Group at the University of Illinois at Urbana–Champaign. J.C. thanks the Jeongsong Cultural Foundation and FMC technologies. Inc. for fellowship support. P.M.K. acknowledges support from the NASA NSTRF (NNX16AM69H).",
year = "2019",
month = jul,
day = "10",
doi = "10.1021/acs.nanolett.9b01563",
language = "English (US)",
volume = "19",
pages = "4588--4593",
journal = "Nano letters",
issn = "1530-6984",
publisher = "American Chemical Society",
number = "7",
}