Electric field-driven point defect pile-up near ZnO polar surfaces

Prashun Gorai, Edmund G. Seebauer

Research output: Contribution to journalArticle

Abstract

Electric fields in near-surface space charge regions influence the spatial distribution of charged defects, with implications for the efficiency of photocatalysts and gas sensors. Through isotopic oxygen diffusion experiments on both Zn-terminated ZnO (0001) and O-terminated ZnO (0001¯), the present work better delineates the quantitative relationship of defect pile-up to the degree and direction of near-surface band bending, the rate of defect injection, and the temperature. The two terminations exhibit dramatic differences in behavior from each other, especially in the temperature dependence. The results suggest that the amount of fixed charge at the surface directly affects the injected flux.

Original languageEnglish (US)
Pages (from-to)95-98
Number of pages4
JournalSolid State Ionics
Volume301
DOIs
StatePublished - Mar 1 2017

Keywords

  • Defect diffusion
  • Polar surface
  • Space charge
  • ZnO

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

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