Elastic scattering cross sections and transport of tin ions in extreme ultraviolet lithography sources

Nathan Bartlett, Andrew Herschberg, Jameson Crouse, Tamar Dallal, Jake Nuttal, Jack Stahl, Niels Braaksma, David Ruzic

Research output: Contribution to journalArticlepeer-review

Abstract

Energetic tin ions are created by laser produced plasmas in extreme-ultraviolet lithography sources where hydrogen must be used as a buffer gas to protect critical optical components. In this study, the quantum chemistry code NWChem is used to calculate the interatomic potential between singly ionized tin and molecular hydrogen. The interatomic potential was fit by an inverse-power potential, a modified universal ZBL potential, and a two-piece-Lennard-Jones potential which were in turn used to calculate the classical distance of closest approach, scattering angle, total elastic scattering cross sections. Furthermore, the universal Ziegler-Biersack-Littmark (ZBL) potential was used in the open-source binary collision approximation codes RustBCA as well as Stopping Range in Matter and Transport of Ion in Matter (SRIM/TRIM) to calculate ion ranges, straggling, and stopping cross sections in a hydrogen gas target.

Original languageEnglish (US)
Article number065411
JournalPhysica Scripta
Volume99
Issue number6
DOIs
StatePublished - Jun 1 2024

Keywords

  • elastic cross section
  • EUV
  • ions
  • lithography
  • tin
  • transport

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Mathematical Physics
  • Condensed Matter Physics

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