Efficient numerical modeling of scattering by electrically large objects in a stratified medium for imaging applications

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Efficient analysis of electromagnetic scattering by electrically large objects in a stratified medium has many applications, and one such application is vectorial imaging and detection of defects in integrated circuits and micro and nano devices. For this application, one not only has to solve Maxwell's equations to find the nearfield distribution, but also has to calculate the far-field over a large number of observation angles to form high-resolution images. The most commonly employed method for such an analysis is the moment method in conjunction with a multilayer Green's function, which takes into account the effect of the stratified medium. However, the efficient evaluation of the multilayer Green's function is quite challenging, to say the least, and the application of the moment method to electrically large objects is very computationally intensive. Even after the currents are computed on the objects, calculating the far field over a large number of observation points is nontrivial and can be very time consuming as well.

Original languageEnglish (US)
Title of host publicationProceedings of the 2019 21st International Conference on Electromagnetics in Advanced Applications, ICEAA 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages591
Number of pages1
ISBN (Electronic)9781728105635
DOIs
StatePublished - Sep 2019
Event21st International Conference on Electromagnetics in Advanced Applications, ICEAA 2019 - Granada, Spain
Duration: Sep 9 2019Sep 13 2019

Publication series

NameProceedings of the 2019 21st International Conference on Electromagnetics in Advanced Applications, ICEAA 2019

Conference

Conference21st International Conference on Electromagnetics in Advanced Applications, ICEAA 2019
Country/TerritorySpain
CityGranada
Period9/9/199/13/19

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Geophysics
  • Radiation
  • Modeling and Simulation
  • Statistics and Probability
  • Instrumentation

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