Efficient analysis of multilayer dielectric coatings with markov chains

T. C. Galvin, James Gary Eden

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new method for analyzing dielectric mirror structures based on Markov Chain analysis will be presented.

Original languageEnglish (US)
Title of host publicationFrontiers in Optics, FIO 2013
PublisherOptical Society of America
ISBN (Print)9781557529879
StatePublished - 2013
EventFrontiers in Optics, FIO 2013 - Orlando, FL, United States
Duration: Oct 6 2013Oct 10 2013

Other

OtherFrontiers in Optics, FIO 2013
CountryUnited States
CityOrlando, FL
Period10/6/1310/10/13

Fingerprint

Markov chains
Markov processes
Multilayers
Mirrors
mirrors
coatings
Coatings

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Galvin, T. C., & Eden, J. G. (2013). Efficient analysis of multilayer dielectric coatings with markov chains. In Frontiers in Optics, FIO 2013 Optical Society of America.

Efficient analysis of multilayer dielectric coatings with markov chains. / Galvin, T. C.; Eden, James Gary.

Frontiers in Optics, FIO 2013. Optical Society of America, 2013.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Galvin, TC & Eden, JG 2013, Efficient analysis of multilayer dielectric coatings with markov chains. in Frontiers in Optics, FIO 2013. Optical Society of America, Frontiers in Optics, FIO 2013, Orlando, FL, United States, 10/6/13.
Galvin TC, Eden JG. Efficient analysis of multilayer dielectric coatings with markov chains. In Frontiers in Optics, FIO 2013. Optical Society of America. 2013
Galvin, T. C. ; Eden, James Gary. / Efficient analysis of multilayer dielectric coatings with markov chains. Frontiers in Optics, FIO 2013. Optical Society of America, 2013.
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