Effects of thin-film nonuniformity on thin-film open end microstrip line for miniature multilayer MMICs

A. S. Rong, V. K. Tripathi, Z. L. Sun

Research output: Contribution to journalArticlepeer-review

Abstract

The effects of thin-film nonuniformity on the open end of thin-film microstrip lines for miniature multilayer MMICs are analysed. The formulation is implemented by the 3-D finite difference method in conjunction with the higher order asymptotic boundary condition. Special treatment of mesh nodes at the corner and the fringes of the boundary is given by interpolation. The results presented show that the field distributions are highly disturbed by the nonuniformity of the thin dielectric film, and that the electrical performance varies as the thin dielectric film is truncated near the open end.

Original languageEnglish (US)
Pages (from-to)1606-1608
Number of pages3
JournalElectronics Letters
Volume30
Issue number19
DOIs
StatePublished - Jan 1 1994

Keywords

  • MMICs
  • Strip lines
  • Thin film circuits

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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