Effects of spatial coherence in diffraction phase microscopy

Chris Edwards, Basanta Bhaduri, Tan Nguyen, Benjamin G. Griffin, Hoa Pham, Taewoo Kim, Gabriel Popescu, Lynford L. Goddard

Research output: Contribution to journalArticle

Abstract

Quantitative phase imaging systems using white light illumination can exhibit lower noise figures than laser-based systems. However, they can also suffer from object-dependent artifacts, such as halos, which prevent accurate reconstruction of the surface topography. In this work, we show that white light diffraction phase microscopy using a standard halogen lamp can produce accurate height maps of even the most challenging structures provided that there is proper spatial filtering at: 1) the condenser to ensure adequate spatial coherence and 2) the output Fourier plane to produce a uniform reference beam. We explain that these objectdependent artifacts are a high-pass filtering phenomenon, establish design guidelines to reduce the artifacts, and then apply these guidelines to eliminate the halo effect. Since a spatially incoherent source requires significant spatial filtering, the irradiance is lower and proportionally longer exposure times are needed. To circumvent this tradeoff, we demonstrate that a supercontinuum laser, due to its high radiance, can provide accurate measurements with reduced exposure times, allowing for fast dynamic measurements.

Original languageEnglish (US)
Pages (from-to)5133-5146
Number of pages14
JournalOptics Express
Volume22
Issue number5
DOIs
StatePublished - Mar 10 2014

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artifacts
spatial filtering
microscopy
halos
diffraction
condensers
tradeoffs
radiance
irradiance
halogens
low noise
luminaires
lasers
topography
illumination
output

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Edwards, C., Bhaduri, B., Nguyen, T., Griffin, B. G., Pham, H., Kim, T., ... Goddard, L. L. (2014). Effects of spatial coherence in diffraction phase microscopy. Optics Express, 22(5), 5133-5146. https://doi.org/10.1364/OE.22.005133

Effects of spatial coherence in diffraction phase microscopy. / Edwards, Chris; Bhaduri, Basanta; Nguyen, Tan; Griffin, Benjamin G.; Pham, Hoa; Kim, Taewoo; Popescu, Gabriel; Goddard, Lynford L.

In: Optics Express, Vol. 22, No. 5, 10.03.2014, p. 5133-5146.

Research output: Contribution to journalArticle

Edwards, C, Bhaduri, B, Nguyen, T, Griffin, BG, Pham, H, Kim, T, Popescu, G & Goddard, LL 2014, 'Effects of spatial coherence in diffraction phase microscopy', Optics Express, vol. 22, no. 5, pp. 5133-5146. https://doi.org/10.1364/OE.22.005133
Edwards C, Bhaduri B, Nguyen T, Griffin BG, Pham H, Kim T et al. Effects of spatial coherence in diffraction phase microscopy. Optics Express. 2014 Mar 10;22(5):5133-5146. https://doi.org/10.1364/OE.22.005133
Edwards, Chris ; Bhaduri, Basanta ; Nguyen, Tan ; Griffin, Benjamin G. ; Pham, Hoa ; Kim, Taewoo ; Popescu, Gabriel ; Goddard, Lynford L. / Effects of spatial coherence in diffraction phase microscopy. In: Optics Express. 2014 ; Vol. 22, No. 5. pp. 5133-5146.
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