Effects of rapid thermal annealing on the device characteristics of quantum well infrared photodetectors

D. K. Sengupta, W. Fang, J. I. Malin, A. P. Curtis, T. Horton, H. C. Kuo, D. Turnbull, C. H. Lin, J. Li, K. C. Hsieh, S. L. Chuang, I. Adesida, M. Feng, S. G. Bishop, G. E. Stillman, J. M. Gibson, H. Chen, J. Mazumder, H. C. Liu

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