Effects of random surface roughness in pixe analysis of thick targets

J. L. Campbell, R. D. Lamb, R. G. Leigh, B. G. Nickel, J. A. Cookson

Research output: Contribution to journalArticle

Abstract

The ratio of proton-induced X-ray yields from thick targets with perfectly smooth and randomly rough surfaces is computed as a function of proton energy, target-detector geometry and X-ray attenuation coefficient. The rough surfaces are obtained by a Monte Carlo technique. Attenuation coefficient is shown to be the dominant parameter governing the effect of roughness.

Original languageEnglish (US)
Pages (from-to)402-412
Number of pages11
JournalNuclear Inst. and Methods in Physics Research, B
Volume12
Issue number3
DOIs
StatePublished - Jan 1 1985
Externally publishedYes

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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