@inproceedings{3eb39ac974db434fa4d637c01cff6e5c,
title = "Effects of interface electronics on the performance of VCSEL-based optical interconnect systems",
abstract = "The performance of optical interconnects is directly related to the characteristics of the electronic interface between the optical interconnect components and the electronic processing elements. In this paper we examine this issue and determine limits on the power and bandwidth of optical interconnects with low threshold VCSEL sources. For a 0.8 μm CMOS process the effects of coupling parasitics and detector capacitance limit signal bandwidth below 500 MHz. The effects of device geometry, fanout, and line length are also studied and show that with existing optoelectronic devices optical interconnects are competitive with electrical connections at the board level, but not below this packaging level.",
author = "Kostuck, {R. K.} and Cangellaris, {Andreas C.} and Boye, {Robert R.}",
year = "1997",
language = "English (US)",
isbn = "0819424161",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "Society of Photo-Optical Instrumentation Engineers",
pages = "77--86",
editor = "Chen, {Ray T.} and Guilfoyle, {Peter S.}",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
note = "Optoelectronic Interconnects and Packaging IV ; Conference date: 12-02-1997 Through 14-02-1997",
}