Effects of interface electronics on the performance of VCSEL-based optical interconnect systems

R. K. Kostuck, Andreas C. Cangellaris, Robert R. Boye

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The performance of optical interconnects is directly related to the characteristics of the electronic interface between the optical interconnect components and the electronic processing elements. In this paper we examine this issue and determine limits on the power and bandwidth of optical interconnects with low threshold VCSEL sources. For a 0.8 μm CMOS process the effects of coupling parasitics and detector capacitance limit signal bandwidth below 500 MHz. The effects of device geometry, fanout, and line length are also studied and show that with existing optoelectronic devices optical interconnects are competitive with electrical connections at the board level, but not below this packaging level.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsRay T. Chen, Peter S. Guilfoyle
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages77-86
Number of pages10
ISBN (Print)0819424161
StatePublished - Dec 1 1997
Externally publishedYes
EventOptoelectronic Interconnects and Packaging IV - San Jose, CA, USA
Duration: Feb 12 1997Feb 14 1997

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume3005
ISSN (Print)0277-786X

Other

OtherOptoelectronic Interconnects and Packaging IV
CitySan Jose, CA, USA
Period2/12/972/14/97

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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