Effects of conductor losses on cross-talk in multilevel coupled VLSI interconnections

T. E. Van Deventer; P. B. Katehi; A. C. Cangellaris

doi:10.1117/12.25530

Effects of conductor losses on cross-talk in multilevel coupled VLSI interconnections

T. E. Van Deventer, P. B. Katehi, A. C. Cangellaris

Research output: Contribution to journal › Conference article › peer-review

Abstract

The influence of conductor losses on the cross-talk between coupled microstrip lines is evaluated using an integral equation method. In this mathematical formulation, the fields are computed inside the conductors and are utilized to define an equivalent impedance on the surface of the strips. This surface impedance is used as a boundary condition for the solution of the electromagnetic problem outside the conductors. Following this procedure the effect of losses on pulse dispersion in coupled microstrip lines is studied thoroughly for various geometries.

Original language	English (US)
Pages (from-to)	285-296
Number of pages	12
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1389
DOIs	https://doi.org/10.1117/12.25530
State	Published - Apr 1 1991
Externally published	Yes
Event	Microelectronic Interconnects and Packages: Optical and Electrical Technologies 1990 - Boston, United States Duration: Nov 4 1990 → Nov 9 1990

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Online availability

10.1117/12.25530

Library availability

Discover UIUC Full Text

Cite this

@article{d4a1904763144b4a8c7c6cdb92f70c77,

title = "Effects of conductor losses on cross-talk in multilevel coupled VLSI interconnections",

abstract = "The influence of conductor losses on the cross-talk between coupled microstrip lines is evaluated using an integral equation method. In this mathematical formulation, the fields are computed inside the conductors and are utilized to define an equivalent impedance on the surface of the strips. This surface impedance is used as a boundary condition for the solution of the electromagnetic problem outside the conductors. Following this procedure the effect of losses on pulse dispersion in coupled microstrip lines is studied thoroughly for various geometries.",

author = "{Van Deventer}, {T. E.} and Katehi, {P. B.} and Cangellaris, {A. C.}",

note = "Publisher Copyright: {\textcopyright} 1991 SPIE. All rights reserved.; Microelectronic Interconnects and Packages: Optical and Electrical Technologies 1990 ; Conference date: 04-11-1990 Through 09-11-1990",

year = "1991",

month = apr,

day = "1",

doi = "10.1117/12.25530",

language = "English (US)",

volume = "1389",

pages = "285--296",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

}

TY - JOUR

T1 - Effects of conductor losses on cross-talk in multilevel coupled VLSI interconnections

AU - Van Deventer, T. E.

AU - Katehi, P. B.

AU - Cangellaris, A. C.

PY - 1991/4/1

Y1 - 1991/4/1

N2 - The influence of conductor losses on the cross-talk between coupled microstrip lines is evaluated using an integral equation method. In this mathematical formulation, the fields are computed inside the conductors and are utilized to define an equivalent impedance on the surface of the strips. This surface impedance is used as a boundary condition for the solution of the electromagnetic problem outside the conductors. Following this procedure the effect of losses on pulse dispersion in coupled microstrip lines is studied thoroughly for various geometries.

AB - The influence of conductor losses on the cross-talk between coupled microstrip lines is evaluated using an integral equation method. In this mathematical formulation, the fields are computed inside the conductors and are utilized to define an equivalent impedance on the surface of the strips. This surface impedance is used as a boundary condition for the solution of the electromagnetic problem outside the conductors. Following this procedure the effect of losses on pulse dispersion in coupled microstrip lines is studied thoroughly for various geometries.

UR - http://www.scopus.com/inward/record.url?scp=0025747123&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0025747123&partnerID=8YFLogxK

U2 - 10.1117/12.25530

DO - 10.1117/12.25530

M3 - Conference article

AN - SCOPUS:0025747123

SN - 0277-786X

VL - 1389

SP - 285

EP - 296

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Microelectronic Interconnects and Packages: Optical and Electrical Technologies 1990

Y2 - 4 November 1990 through 9 November 1990

ER -

Effects of conductor losses on cross-talk in multilevel coupled VLSI interconnections

Abstract

ASJC Scopus subject areas

Online availability

Library availability

Related links

Fingerprint

Cite this