@inproceedings{fe51ba149aee4ed984e1bc0377a64f26,
title = "Effect of selenium evaporation rate on ultrathin Cu(In,Ga)Se2 films",
abstract = "The selenium (Se) rate has been shown to have a significant influence on the deposition of high quality Cu(In,Ga)Se2 thin films. This has been observed primarily by exsitu experiments on thick Cu(In,Ga)Se2 films. In this paper, we present the influence of the Se rate on the properties of both thick and ultrathin CIGS films as measured by in-situ real time spectroscopic ellipsometry (RTSE). These measurements were correlated with ex-situ measurements performed by variable angle spectroscopic ellipsometry, X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and X-ray fluorescence (XRF) to analyze the crystal structure, surface morphology, composition ratio and the fundamental optical constants of Cu(In,Ga)Se2 thin films deposited with different Se evaporation rates.",
keywords = "CIGS, co-evaporation, selenium rate, spectroscopic ellipsometry, ultrathin",
author = "Krishna Aryal and Grace Rajan and Tasnuva Ashrafee and Vikash Ranjan and Jian Li and Angus Rockett and Collins, {Robert W.} and Sylvain Marsillac",
note = "Publisher Copyright: {\textcopyright} 2014 IEEE.; 40th IEEE Photovoltaic Specialist Conference, PVSC 2014 ; Conference date: 08-06-2014 Through 13-06-2014",
year = "2014",
month = oct,
day = "15",
doi = "10.1109/PVSC.2014.6924921",
language = "English (US)",
series = "2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "314--317",
booktitle = "2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014",
address = "United States",
}