@inproceedings{5bb5a151a935415b9333b52c82abdd75,
title = "Effect of on-chip ESD protection on 10 Gb/s receivers",
abstract = "Parasitic elements at the input of a high-speed receiver may limit bandwidth. A test chip was designed to quantify the impact of ESD protection on the performance of a 10 Gb/s receiver. Negative capacitance circuits are shown to improve signal integrity and their impact on ESD resiliency is measured.",
author = "Faust, {Adam C.} and Ankit Srivastava and Elyse Rosenbaum",
year = "2011",
language = "English (US)",
isbn = "1585371971",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
booktitle = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings - 2011, EOS/ESD 2011",
note = "2011 33rd Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2011 ; Conference date: 11-09-2011 Through 16-09-2011",
}