Effect of finite metallization thickness on radiation characteristics of a dielectric waveguide loaded with periodic strips

Aosheng Rong, Sifan Li

Research output: Contribution to journalConference articlepeer-review

Abstract

The spectral domain approach is extended to analyzing the radiation of millimeter waves from a dielectric waveguide periodically loaded with thick metallic strips. The formulation views the electric current sheets on the upper and lower surfaces, and inside the strips as the source quantities to be determined so that the original problem is modelled as a multilevel-thin-strips-loaded dielectric waveguide, which, in turn, may be analyzed by the spectral domain approach. The radiation characteristics are demonstrated as a function of the strip thickness. It is shown that there is a significant difference in the leakage constants of TE and TM mode excitations.

Original languageEnglish (US)
Article number15143U
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume1514
DOIs
StatePublished - 1990
Event15th International Conference on Infrared and Millimeter Waves 1990 - Orlando, United States
Duration: Dec 10 1990Dec 14 1990

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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