Edge effects in buckled thin films on elastomeric substrates

C. T. Koh; Z. J. Liu; D. Y. Khang; J. Song; C. Lu; Y. Huang; J. A. Rogers; C. G. Koh

doi:10.1063/1.2791004

Edge effects in buckled thin films on elastomeric substrates

C. T. Koh, Z. J. Liu, D. Y. Khang, J. Song, C. Lu, Y. Huang, J. A. Rogers, C. G. Koh

Research output: Contribution to journal › Article › peer-review

Abstract

Buckled thin films on elastomeric substrates have many applications. Films of this type exhibit periodic, sinusoidal "wavy" relief profiles, except near edges that lie perpendicular to the wavevector associated with waves. In these locations, the amplitudes of the waves steadily decrease until the films become completely flat, in a manner that can be used to advantage in applications. This paper quantitatively describes the mechanics of this phenomenon. The finite element analysis shows that the edge effect results from the traction-free boundary condition. The edge-effect length is proportional to the thin-film thickness, and decreases with the increasing prestrain and substrate modulus.

Original language	English (US)
Article number	133113
Journal	Applied Physics Letters
Volume	91
Issue number	13
DOIs	https://doi.org/10.1063/1.2791004
State	Published - 2007
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.2791004

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title = "Edge effects in buckled thin films on elastomeric substrates",

abstract = "Buckled thin films on elastomeric substrates have many applications. Films of this type exhibit periodic, sinusoidal {"}wavy{"} relief profiles, except near edges that lie perpendicular to the wavevector associated with waves. In these locations, the amplitudes of the waves steadily decrease until the films become completely flat, in a manner that can be used to advantage in applications. This paper quantitatively describes the mechanics of this phenomenon. The finite element analysis shows that the edge effect results from the traction-free boundary condition. The edge-effect length is proportional to the thin-film thickness, and decreases with the increasing prestrain and substrate modulus.",

author = "Koh, {C. T.} and Liu, {Z. J.} and Khang, {D. Y.} and J. Song and C. Lu and Y. Huang and Rogers, {J. A.} and Koh, {C. G.}",

note = "Funding Information: The authors acknowledge the support from Institute of High Performance Computing in Singapore, the National Science Foundation (DMI-0328162), and the U.S. Department of Energy, Division of Materials Sciences (DEFG02-91ER45439). ",

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doi = "10.1063/1.2791004",

language = "English (US)",

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AU - Koh, C. T.

AU - Liu, Z. J.

AU - Khang, D. Y.

AU - Song, J.

AU - Lu, C.

AU - Huang, Y.

AU - Rogers, J. A.

AU - Koh, C. G.

N1 - Funding Information: The authors acknowledge the support from Institute of High Performance Computing in Singapore, the National Science Foundation (DMI-0328162), and the U.S. Department of Energy, Division of Materials Sciences (DEFG02-91ER45439).

PY - 2007

Y1 - 2007

N2 - Buckled thin films on elastomeric substrates have many applications. Films of this type exhibit periodic, sinusoidal "wavy" relief profiles, except near edges that lie perpendicular to the wavevector associated with waves. In these locations, the amplitudes of the waves steadily decrease until the films become completely flat, in a manner that can be used to advantage in applications. This paper quantitatively describes the mechanics of this phenomenon. The finite element analysis shows that the edge effect results from the traction-free boundary condition. The edge-effect length is proportional to the thin-film thickness, and decreases with the increasing prestrain and substrate modulus.

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Edge effects in buckled thin films on elastomeric substrates

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