Dynamics of microcantilever integrated with geometric nonlinearity for stable and broadband nonlinear atomic force microscopy

Hanna Cho, Min Feng Yu, Alexander F. Vakakis, Lawrence A. Bergman, D. Michael McFarland

Research output: Contribution to journalArticlepeer-review

Abstract

We explore the use of a nonlinear cantilever system integrating geometric nonlinearity for AFM imaging, in contrast from the traditional linear cantilever system. The intrinsically nonlinear AFM cantilever system exhibits broadband resonance over a bandwidth several times of its linear resonant frequency and possesses an intrinsic stability that virtually eliminates the instability induced by the tip-sample interactions involved in a linear AFM system, thus the artifact of image contrast reversal. The ability to realize broadband operation may extend the application of AFM to spectral analysis of tip-sample interactions across a broad frequency range at the nanoscale.

Original languageEnglish (US)
Pages (from-to)L74-L78
JournalSurface Science
Volume606
Issue number17-18
DOIs
StatePublished - Sep 2012

Keywords

  • Broadband resonance
  • Dynamics
  • Geometric nonlinearity
  • Imaging instability
  • Scanning probe microscopy

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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