TY - GEN
T1 - Do read errors matter for genome assembly?
AU - Shomorony, Ilan
AU - Courtade, Thomas
AU - Tse, David
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/9/28
Y1 - 2015/9/28
N2 - While most current high-throughput DNA sequencing technologies generate short reads with low error rates, emerging sequencing technologies generate long reads with high error rates. A basic question of interest is the tradeoff between read length and error rate in terms of the information needed for the perfect assembly of the genome. Using an adversarial erasure error model, we make progress on this problem by establishing a critical read length, as a function of the genome and the error rate, above which perfect assembly is guaranteed. For several real genomes, including those from the GAGE dataset, we verify that this critical read length is not significantly greater than the read length required for perfect assembly from reads without errors.
AB - While most current high-throughput DNA sequencing technologies generate short reads with low error rates, emerging sequencing technologies generate long reads with high error rates. A basic question of interest is the tradeoff between read length and error rate in terms of the information needed for the perfect assembly of the genome. Using an adversarial erasure error model, we make progress on this problem by establishing a critical read length, as a function of the genome and the error rate, above which perfect assembly is guaranteed. For several real genomes, including those from the GAGE dataset, we verify that this critical read length is not significantly greater than the read length required for perfect assembly from reads without errors.
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U2 - 10.1109/ISIT.2015.7282589
DO - 10.1109/ISIT.2015.7282589
M3 - Conference contribution
AN - SCOPUS:84969784638
T3 - IEEE International Symposium on Information Theory - Proceedings
SP - 919
EP - 923
BT - Proceedings - 2015 IEEE International Symposium on Information Theory, ISIT 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - IEEE International Symposium on Information Theory, ISIT 2015
Y2 - 14 June 2015 through 19 June 2015
ER -