DNA-templated free-standing nanowires with controllable dimensions for in-situ TEM analysis

S. Mani, J. Han, T. Saif, G. Richter, E. Arzt

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a method to fabricate free-standing nanowires of various metals with controllable dimensions using λ-DNA as template for in situ Transmission electron microscopic observations. The nanowires were formed by sputter depositing or evaporating metal on DNA-strands bridging Focused Ion Beam cut narrow trenches on circular silicon heating platforms (3mm dia.). The platforms were microfabricated and compatible with any commercially available TEM holder. The nanowire dimensions (20-100 nm in diameter and 1-5 μm in length) were varied by controlling the deposition time and trench width. In situ observation during thermal annealing showed no grain growth in Al and sporadic grain growth in Au. The reason for no grain growth in Al could be due to Aluminum oxide and surface morphology. Continued annealing of the Al nanowires melted the metal leaving behind aluminum oxide nanotubes.

Original languageEnglish (US)
Title of host publication2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages537-539
Number of pages3
ISBN (Print)1424400783, 9781424400782
DOIs
StatePublished - Jan 1 2006
Event2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006 - Cincinnati, OH, United States
Duration: Jun 17 2006Jun 20 2006

Publication series

Name2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
Volume2

Other

Other2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
CountryUnited States
CityCincinnati, OH
Period6/17/066/20/06

Keywords

  • DNA
  • Grain growth
  • Nanotubes
  • Nanowires
  • TEM

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Materials Science(all)

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    Mani, S., Han, J., Saif, T., Richter, G., & Arzt, E. (2006). DNA-templated free-standing nanowires with controllable dimensions for in-situ TEM analysis. In 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006 (pp. 537-539). [1717157] (2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006; Vol. 2). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/nano.2006.247707