TY - GEN
T1 - Distribution high impedance fault location using localized voltage magnitude measurements
AU - Hossain, Shamina
AU - Zhu, Hao
AU - Overbye, Thomas
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2014/11/21
Y1 - 2014/11/21
N2 - The detection and location of high impedance faults has historically been a difficult endeavor due to the low currents produced. However, the recent advent of distributed voltage monitoring devices, enabling access to fast-sampled, expansive voltage measurements throughout a distribution network, can ease this task. This paper considers the potential to use these distribution level devices to detect and locate such faults. A simulation-based method is proposed that compares a measured voltage profile, obtained from the devices, and simulated voltage profiles at various locations using a power system simulation software. The simulation locations are intelligently selected using the Golden section search and possible fault impedance values are iterated through for each location. The L1-norm is used to compare the two profiles, with the lowest error norm representing the best match - the most likely fault location and impedance.
AB - The detection and location of high impedance faults has historically been a difficult endeavor due to the low currents produced. However, the recent advent of distributed voltage monitoring devices, enabling access to fast-sampled, expansive voltage measurements throughout a distribution network, can ease this task. This paper considers the potential to use these distribution level devices to detect and locate such faults. A simulation-based method is proposed that compares a measured voltage profile, obtained from the devices, and simulated voltage profiles at various locations using a power system simulation software. The simulation locations are intelligently selected using the Golden section search and possible fault impedance values are iterated through for each location. The L1-norm is used to compare the two profiles, with the lowest error norm representing the best match - the most likely fault location and impedance.
KW - distributed monitoring devices
KW - fault location
KW - high impedance fault
KW - voltage sags
UR - http://www.scopus.com/inward/record.url?scp=84918534824&partnerID=8YFLogxK
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U2 - 10.1109/NAPS.2014.6965403
DO - 10.1109/NAPS.2014.6965403
M3 - Conference contribution
AN - SCOPUS:84918534824
T3 - 2014 North American Power Symposium, NAPS 2014
BT - 2014 North American Power Symposium, NAPS 2014
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 North American Power Symposium, NAPS 2014
Y2 - 7 September 2014 through 9 September 2014
ER -