Abstract

A method of examining a sample comprises exposing the sample to a pump pulse of electromagnetic radiation for a first period of time, exposing the sample to a stimulant pulse of electromagnetic radiation for a second period of time which overlaps in time with at least a portion of the first exposing, to produce a signal pulse of electromagnetic radiation for a third period of time, and interfering the signal pulse with a reference pulse of electromagnetic radiation, to determine which portions of the signal pulse were produced during the exposing of the sample to the stimulant pulse. The first and third periods of time are each greater than the second period of time.
Original languageEnglish (US)
U.S. patent number7586618
StatePublished - Sep 8 2009

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