We describe the displacement detection of freestanding silicon  nanowires by fiber-optic interferometry. We observe approximately a 50-fold enhancement in the scattered intensity for nanowires 40-60 nm in diameter for incident light polarized parallel to the nanowire axis, as compared to perpendicular polarization. This enhancement enables us to achieve a displacement sensitivity of 0.5 pmHz for 15 μW of light incident on the nanowire. The nanowires exhibit ultralow mechanical dissipation in the range of (2× 10-15) - (2× 10-14) kgs and could be used as mechanical sensors for ultrasensitive scanning probe force measurements.
|Original language||English (US)|
|Journal||Applied Physics Letters|
|State||Published - 2008|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)