Dispersion of picosecond pulses propagating on microstrip interconnections on semiconductor integrated-circuit substrates

Michael F. Pasik; Andreas C. Cangellaris; John L. Prince

doi:10.1117/12.25531

Dispersion of picosecond pulses propagating on microstrip interconnections on semiconductor integrated-circuit substrates

Michael F. Pasik, Andreas C. Cangellaris, John L. Prince

Research output: Contribution to journal › Conference article › peer-review

Abstract

A weighted residual formulation for the transverse electric field is presented for the finite-element analysis of microstrip transmission lines on semiconductor substrates. The frequency dependence of the effective dielectric constant and the attenuation constant of the transmission lines are examined. The results from the full-wave analysis are used to determine when a quasi-TEM analysis is applicable.

Original language	English (US)
Pages (from-to)	297-301
Number of pages	5
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1389
DOIs	https://doi.org/10.1117/12.25531
State	Published - Apr 1 1991
Externally published	Yes
Event	Microelectronic Interconnects and Packages: Optical and Electrical Technologies 1990 - Boston, United States Duration: Nov 4 1990 → Nov 9 1990

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.25531

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Dispersion of picosecond pulses propagating on microstrip interconnections on semiconductor integrated-circuit substrates. / Pasik, Michael F.; Cangellaris, Andreas C.; Prince, John L.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 1389, 01.04.1991, p. 297-301.

Research output: Contribution to journal › Conference article › peer-review

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abstract = "A weighted residual formulation for the transverse electric field is presented for the finite-element analysis of microstrip transmission lines on semiconductor substrates. The frequency dependence of the effective dielectric constant and the attenuation constant of the transmission lines are examined. The results from the full-wave analysis are used to determine when a quasi-TEM analysis is applicable.",

author = "Pasik, {Michael F.} and Cangellaris, {Andreas C.} and Prince, {John L.}",

note = "Funding Information: This research was supported in part by the Semiconductor Research Corporation. Publisher Copyright: {\textcopyright} 1991 SPIE. All rights reserved.; Microelectronic Interconnects and Packages: Optical and Electrical Technologies 1990 ; Conference date: 04-11-1990 Through 09-11-1990",

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AB - A weighted residual formulation for the transverse electric field is presented for the finite-element analysis of microstrip transmission lines on semiconductor substrates. The frequency dependence of the effective dielectric constant and the attenuation constant of the transmission lines are examined. The results from the full-wave analysis are used to determine when a quasi-TEM analysis is applicable.

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JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Microelectronic Interconnects and Packages: Optical and Electrical Technologies 1990

Y2 - 4 November 1990 through 9 November 1990

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Dispersion of picosecond pulses propagating on microstrip interconnections on semiconductor integrated-circuit substrates

Abstract

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