Disorder-driven hysteresis-loop criticality in Co/CoO films

A. Berger, A. Inomata, J. S. Jiang, J. E. Pearson, S. D. Bader, Karin Dahmen

Research output: Contribution to journalConference article

Abstract

The effect of magnetic disorder on the magnetization reversal process in thin Co/CoO films has been investigated. The antiferromagnetic CoO layer allows a reversible tuning of the magnetic disorder by simple temperature variation. For temperatures above a critical temperature Tc, we observe a discontinuous magnetization reversal, whereas smooth magnetization loops occur for T<Tc. Our measurements establish the existence of a disorder-driven critical point in the nonequilibrium phase diagram. In addition, we observe scaling behavior in the vicinity of the critical point and determine the critical exponents to β=0.022±0.006 and βδ=0.30±0.03.

Original languageEnglish (US)
Pages (from-to)7466-7468
Number of pages3
JournalJournal of Applied Physics
Volume89
Issue number11 II
DOIs
StatePublished - Jun 1 2001
Event8th Joint Magnetism and Magnetic Materials-Intermag Conference - San Antonio, TX, United States
Duration: Jan 7 2001Jan 11 2001

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Disorder-driven hysteresis-loop criticality in Co/CoO films'. Together they form a unique fingerprint.

  • Cite this

    Berger, A., Inomata, A., Jiang, J. S., Pearson, J. E., Bader, S. D., & Dahmen, K. (2001). Disorder-driven hysteresis-loop criticality in Co/CoO films. Journal of Applied Physics, 89(11 II), 7466-7468. https://doi.org/10.1063/1.1361272