TY - JOUR
T1 - Direct, Transfer-Free Growth of Large-Area Hexagonal Boron Nitride Films by Plasma-Enhanced Chemical Film Conversion (PECFC) of Printable, Solution-Processed Ammonia Borane
AU - Liu, Tianqi
AU - Premasiri, Kasun
AU - Sui, Yongkun
AU - Zhan, Xun
AU - Mustafa, Haithem A.B.
AU - Akkus, Ozan
AU - Zorman, Christian A.
AU - Gao, Xuan P.A.
AU - Sankaran, R. Mohan
N1 - Funding Information:
This work was supported by the Department of Energy Basic Energy Sciences (DOE-BES) Grant DE-AC02-09CH11466. K.P and X.G acknowledge support by the National Science Foundation (NSF) under Grant DMR-1151534. H.A.B.M. and O.A. acknowledge support by NSF under Grant MRI-1531035. We thank J. Toth for help with setup and electrical characterization of the DBD, J. Cole and H. Ishida for help with micro-Raman spectroscopy, and S. Bhattacharya for help with AFM characterization. STEM imaging was carried out in the Frederick Seitz Materials Research Laboratory at the University of Illinois.
Publisher Copyright:
© 2018 American Chemical Society.
PY - 2018/12/19
Y1 - 2018/12/19
N2 - Synthesis of large-area hexagonal boron nitride (h-BN) films for two-dimensional (2D) electronic applications typically requires high temperatures (∼1000 °C) and catalytic metal substrates which necessitate transfer. Here, analogous to plasma-enhanced chemical vapor deposition, a nonthermal plasma is employed to create energetic and chemically reactive states such as atomic hydrogen and convert a molecular precursor film to h-BN at temperatures as low as 500 °C directly on metal-free substrates - a process we term plasma-enhanced chemical film conversion (PECFC). Films containing ammonia borane as a precursor are prepared by a variety of solution processing methods including spray deposition, spin coating, and inkjet printing and reacted in a cold-wall reactor with a planar dielectric barrier discharge operated at atmospheric pressure in a background of argon or a mixture of argon and hydrogen. Systematic characterization of the converted h-BN films by micro-Raman spectroscopy shows that the minimum temperature for nucleation on silicon-based substrates can be decreased from 800 to 500 °C by the addition of a plasma. Furthermore, the crystalline domain size, as reflected by the full width at half-maximum, increased by more than 3 times. To demonstrate the potential of the h-BN films as a gate dielectric in 2D electronic devices, molybdenum disulfide field effect transistors were fabricated, and the field effect mobility was found to be improved by up to 4 times over silicon dioxide. Overall, PECFC allows h-BN films to be grown at lower temperatures and with improved crystallinity than CVD, directly on substrates suitable for electronic device fabrication.
AB - Synthesis of large-area hexagonal boron nitride (h-BN) films for two-dimensional (2D) electronic applications typically requires high temperatures (∼1000 °C) and catalytic metal substrates which necessitate transfer. Here, analogous to plasma-enhanced chemical vapor deposition, a nonthermal plasma is employed to create energetic and chemically reactive states such as atomic hydrogen and convert a molecular precursor film to h-BN at temperatures as low as 500 °C directly on metal-free substrates - a process we term plasma-enhanced chemical film conversion (PECFC). Films containing ammonia borane as a precursor are prepared by a variety of solution processing methods including spray deposition, spin coating, and inkjet printing and reacted in a cold-wall reactor with a planar dielectric barrier discharge operated at atmospheric pressure in a background of argon or a mixture of argon and hydrogen. Systematic characterization of the converted h-BN films by micro-Raman spectroscopy shows that the minimum temperature for nucleation on silicon-based substrates can be decreased from 800 to 500 °C by the addition of a plasma. Furthermore, the crystalline domain size, as reflected by the full width at half-maximum, increased by more than 3 times. To demonstrate the potential of the h-BN films as a gate dielectric in 2D electronic devices, molybdenum disulfide field effect transistors were fabricated, and the field effect mobility was found to be improved by up to 4 times over silicon dioxide. Overall, PECFC allows h-BN films to be grown at lower temperatures and with improved crystallinity than CVD, directly on substrates suitable for electronic device fabrication.
KW - boron nitride (BN)
KW - chemical vapor deposition (CVD)
KW - plasma
KW - two-dimensional (2D) material
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U2 - 10.1021/acsami.8b17152
DO - 10.1021/acsami.8b17152
M3 - Article
C2 - 30462491
AN - SCOPUS:85058850282
SN - 1944-8244
VL - 10
SP - 43936
EP - 43945
JO - ACS applied materials & interfaces
JF - ACS applied materials & interfaces
IS - 50
ER -