Direct observation of electrical properties of grain boundaries in sputter-deposited CdTe using scan-probe microwave reflectivity based capacitance measurements

Polycrystalline CdTe in 12% efficient solar cells has been studied using scanning microwave impedance microscopy (sMIM). The CdS/CdTe junctions were grown on transparent-conducting-oxide-coated soda lime glass using rf sputter deposition. sMIM based capacitance measurements were performed on the exposed surface of CdCl₂ treated CdTe adjacent to thermal-evaporation-deposited Cu/Au back contacts. The sMIM instrument was operated at ∼3 GHz, and capacitance measurements were performed as a function of ac and dc voltage biases applied to the tip, with and without sample illumination. Although dc capacitance measurements are affected by sample topography, the differential capacitance measurement was shown to be topography independent. It was found that the grain boundaries exhibit a depleted carrier concentration as compared to the grain bulk. This depletion effect is enhanced under photo-generated carrier separation or under sufficiently large probe tip biases opposite to the majority carrier charge.