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Direct measurements of irradiation-induced creep in micropillars of amorphous Cu56Ti38Ag6, Zr52Ni48, Si, and SiO2
Sezer Özerinç, Hoe Joon Kim, Robert S Averback, William Paul King
- Materials Science and Engineering
- Mechanical Science and Engineering
- Grainger College of Engineering
- Materials Research Lab
- Information Trust Institute
- Micro and Nanotechnology Lab
- Beckman Institute for Advanced Science and Technology
- Electrical and Computer Engineering
- Biomedical and Translational Sciences
Research output: Contribution to journal › Article › peer-review