Fingerprint
Dive into the research topics of 'Diffusion of point defects near stacking faults in 3C-SiC via first-principles calculations'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Diffusion of point defects near stacking faults in 3C-SiC via first-principles calculations
Jianqi Xi, Bin Liu, Fenglin Yuan, Yanwen Zhang, William J. Weber
Research output: Contribution to journal › Article › peer-review