Skip to main navigation Skip to search Skip to main content

Diffusion of point defects near stacking faults in 3C-SiC via first-principles calculations

  • Jianqi Xi
  • , Bin Liu
  • , Fenglin Yuan
  • , Yanwen Zhang
  • , William J. Weber

Research output: Contribution to journal › Article › peer-review

Fingerprint

Dive into the research topics of 'Diffusion of point defects near stacking faults in 3C-SiC via first-principles calculations'. Together they form a unique fingerprint.
Sort by

Keyphrases

Material Science