Abstract
Measurements of Bi and Au diffusion in nanocrystalline (n-) Cu and of Bi in copper thin films have been performed. The results show that (a) the diffusivity in n-Cu can be enhanced by more than ten orders of magnitude with respect to that in single-crystalline Cu. (b) Grain boundaries in n-Cu have a higher free energy and volume than conventional grain boundaries. (c) Relaxation can take place in n-Cu. (d) Diffusion measurements in n-materials represent a convenient means to determine thermodynamic properties such as grain boundary energies, solubilities, heats of segregation, and solution.
Original language | English (US) |
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Pages (from-to) | 3832-3839 |
Number of pages | 8 |
Journal | Journal of Applied Physics |
Volume | 74 |
Issue number | 6 |
DOIs | |
State | Published - 1993 |
ASJC Scopus subject areas
- General Physics and Astronomy