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Diffraction phase microscopy with white light

  • Gabriel Popescu (Inventor)
  • , Basanta Bhaduri (Inventor)
  • , Hoa V Pham (Inventor)

Research output: Patent

Abstract

A microscope and methods for obtaining a phase image of a substantially transparent specimen. Light collected from a specimen illuminated by a temporally incoherent source is diffracted into a first order and either the zeroth or first order is low-pass filtered in a Fourier transform plane before the orders are recombined at a focal plane detector. By low pass filtering the first order diffracted beam into a plurality of wavelengths, a spectrally- and spatially-resolved quantitative phase image of the specimen is obtained.
Original languageEnglish (US)
U.S. patent number8837045
Filing date2/25/13
StatePublished - Sep 16 2014

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